材料科學
拉曼光譜已成功應用於分析各種材料和系統。
Renishaw 以獲獎無數的 inVia™ 共軛焦拉曼顯微鏡、拉曼/掃描測頭組合顯微系統,以及 SEM 拉曼組合型系統等創新科技,成功實現此項目標。
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Application note: Improving tool bits and ultra-hard coatings using the inVia™ microscope [en]
Manufacturers face many challenges when producing high-quality tool bits. The primary need is to manufacture tools of a consistently high standard. The inVia Raman microscope can determine the stress and crystallinity of the materials used in tool bits.